Microscopy and Imaging Facility (MIF)

The Microscopy and Imaging Facility (MIF) provides instrument access and services related to Light Microscopy, Transmission Electron Microscopy (TEM), Electron Tomography (ET), Scanning Electron Microscopy (SEM), and Atomic Force Microscopy (AFM). Microscopes can be operated by MIF technicians or directly by users after training. The MIF can also provide sample preparation and assist with data analysis and interpretation.

AT THIS FACILITY:

  • Transmission Electron Microscope
  • Electron Tomography (3D)
  • Scanning Electron Microscope
  • Atomic Force Microscope
  • Ultramicrotomes (+cryo)
  • Sample Coating Devices

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